Pitch Error Measurement System
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Fast & Efficient — <1 s measurement cycle for higher throughput.
High Precision — Sub-micron repeatability and 0.001 μm resolution.
Multi-Platform Compatibility — One platform for V-groove, FA, and MT connector inspection.
Production-Ready Automation — Automated measurement, compensation, and reporting.
Smart Data Integration — SPC/MES connectivity for traceability.
Advanced Imaging — High-resolution optics for accurate defect and geometry inspection.